Arbin Instruments, Inc. has developed a new product series designed for customers requiring high rate discharge testing. The High Rate Discharge Tester (HRDT) series provides customers with the equipment required for performing SLI cranking tests, and other similar cold cranking discharge profiles. With Arbin's HRDT system, users can define custom and standardize discharge schedules (EN, DIN, SAE, JS etc.) test profiles for any testing application. HRDT systems are available with power ratings from 45kW to 120kW, peak power, or 22.5kW to 60kW, respectively. The need for reliable automotive battery test equipment has continued to grow as the demand for high power density batteries increases.
The HRDT series provides the circuitry required for high rate discharge testing, with the ability to add charge current to maintain proper control over the device under test. The HRDT series is built on over twenty years of providing reliable test equipment, designed to operate 24/7 year round. Arbin's equipment provides a safe and accountable test environment, with hardware and software based safety settings to protect the user, facility, and the equipment.
Models in the HRDT series include: a unit rated for 22.5kW continuous or 45kW peak that can handle 48V/925A or 30V/1500A; a unit rated for 36kW continuous or 72kW peak that can handle 30V/2500A or 48V/1500A; a unit rated for 48kW continuous or 96kW peak that can handle 48V/2000A or 60V/1600A; and a unit rated for 60kW continuous or 120kW peak that can handle 48V/2500A or 80V/1500A.
Arbin's background of manufacturing custom-built test equipment has enabled the company to design several standard models ranging from tens up to several hundred kilowatts. Test equipment can be customized with a range of voltage and current specifications, including optional features to monitor cell temperature, voltage, pressure, and other valuable parameters. The HRDT series provides the circuitry required for high rate discharge testing, with the ability to add charge current to maintain proper control over the device under test.