Chroma Systems Solutions has added the 19036 Wound Component Electrical Safety Test (EST) Analyzer with a 5kVac/ 6kVdc high-voltage output, 5kV insulation resistance, 6kV layer short impulse voltage and 4-wire dc resistance measurement with a maximum output of up to 40 channels. Capable of outputting and measuring AC100mA/DC 20mA, Chroma’s 19036 is suitable for testing to high-power motor standards such as UL 1004-1. Its 500VA design is also compliant with the output power requirements of EC/UL. Wound component applications include EV motors, servomotors, ascension motors, transformers and solenoid valves.
Chroma's 19036 Wound Component EST Analyzer impulse winding test imposes a non-destructive, high speed and low energy voltage impulse on the device under test for analysis and comparison. The purpose of impulse winding test is to discover potential defects such as layer short, corona or partial discharge usually difficult to find in wound components during early phases of design and production. Analysis of the impulse test can be determined by Area Size, Differential Area, Flutter Value or Laplacian method.
The 19036 is equipped with a patented 4-wire DC resistance test that has both Drive and Sense in compliance with withstanding specification and provides 10 channels of 4-wire DC resistance test functions. Up to 40 channels of scanning test can be conducted when the 19036 is configured with the optional 16 channel external HV scan boxes.
The 19036 includes Flashover Detection built-in. Flashover is an electrical breakdown of a gas that produces an ongoing plasma discharge, resulting from a current flowing through normally nonconductive media such as air. Since flashover cannot be simply detected by the leakage current rms value, the Flashover Detection feature is an invaluable part of the HV test. For Contact Checking during the hipot test, the 19036 is equipped with a High Frequency Contact Check (HFCC). By conducting the Contact Check during Hipot test, it can increase the test reliability and efficiency significantly by identifying test fail problems caused by bad contact of cabling or the test fixture.